专利名称：Circuit board testing apparatus and method发明人：Munehiro Yamashita,Michio Kaida申请号：US09822755申请日：20010330
公开号：US20010013783A1公开日：20010816
摘要：A probe is made to contact one end of the test wiring of a circuit board , with ahead electrostatically coupled to the other end of said wiring. A pulse-like DC voltage issupplied from a signal source , and, simultaneously with a switch section SWp turning on,the maximum voltage is applied to the test wiring. If a detection signal is below aspecified value, then a computer will read it as “open” or “shorting”. Further, a tip aof the head is associated with the circuit board only through an insulating sheet , so thatthe tip a is kept away from each pad of a pad section on the board at a fixed distance(equivalent to the thickness of insulating sheet ). Thus, continuity testing may beperformed in a non-contact manner by moving head only in X and Y directions withoutmovement in the Z-direction.
申请人：YAMASHITA MUNEHIRO,KAIDA MICHIO
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